Steady-state fluorescence (SSF) technique in conjunction with UV-visible (UVV) technique atomic force microscope (AFM) and scanning electron microscope (SEM) is used for studying film formation from TiO2 covered polystyrene (PS) latex particles. The effects of TiO2 content film thickness and PS particle size on film formation and structure properties of PS/TiO2 composites are studied. For this purpose in the first part two different sets of PS films with thicknesses of 5 and 20 mu m were prepared ...