Characterization of Mps Capped Cds Quantum Dots and Formation Self-Assembled Quantum Dots Thin Films on a Glass Substrate

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Date

2011

Authors

Koç, Kenan
Tepehan, Fatma Zehra
Tepehan, Galip Gültekin

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Natl Inst R&D Materials Physics

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Abstract

Colloidal powdered and thin film forms of MPS capped CdS quantum dots have been produced by combination of colloidal chemistry and sol-gel method. Nanoparticles were self-assembled directly on a glass substrate using spin coating method without introducing any matrix. Colloidal powdered and thin film forms were characterised by absorbance photolimunescence XRD FT-IR HRTEM and AFM measurements. The HRTEM images give a grain size of 2.5-3.0 nm and this is in agreement with the values found in the absorbance and XRD measurement. Average size of the quantum dots increase with increasing of heat treatment temperature due to Oswald ripening.

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CdS quantum dots, Self-assembled thin film precursor, 3-Mercaptopropyl-trimethoxysilane (MPS), Sol-gel method

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13

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Q3

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Volume

8

Issue

4

Start Page

239

End Page

247